Abstract: The image excellence and resolution of the Atomic Force Microscope (AFM) functioning in tapping method is reliant on the quality (Q) factor of the detecting microcantilever. Decreasing the cantilever quality (Q) factor in the atomic force microscope (AFM), when functioning in tapping method permits for an increase in imaging speed. Though, this system uses a passive electrical impedance to modify the mechanical dynamics of the cantilever, which limits the amount of Q factor reduction possible. This paper describes that additional decrease in the cantilever Q factor may be found with the use of an active impedance in the piezoelectric shunt control method. The active impedance factors are considered in such a way that the piezoelectric shunt controller imitates a positive position feedback controller in a displacement feedback control loop. A significant decrease in cantilever Q factor is achieved using an active impedance compared with that realized with a passive impedance.
Keywords: Atomic Force Microscopy (AFM), micro cantilever, piezoelectric shunts control, tapping mode, Positive Position Feedback.
Title: Active Q Control of an AFM Micro Cantilever Using PPF Controller
Author: Asha, Taranath H B
International Journal of Electrical and Electronics Research
ISSN 2348-6988 (online)
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