Abstract: Increasing growth of sub-micron technology in the semiconductor industry has resulted in the difficulty of VLSI testing for designers who always look for simple, regular and cascadable logic structure to realize a complex function. A system composing of cells interconnected in a regular manner whose behavior advances in time in discrete steps is called Cellular Automata (CA). The main goal of this paper is to analyze CA for built in test pattern generation and analyze the test response, hence minimizing the problems related to VLSI testing. Further, Linear Feedback Shift Register (LFSR) and CA are compared. Also, efficient test patterns using CA are explained, along with a plan to improve energy conservation in CA and to generate a power test in order to check the fault coverage.
Keywords: Built in Self-Test, Cellular Automata, Linear Feedback Shift Register, Signature Srutinization, Test Pattern Generator and Analyzer.
Title: CELLULAR AUTOMATA FOR BUILT IN TEST PATTERN GENERATION AND TEST RESPONSE ANALYZER
Author: Harshala Patil, Shyam Sunder Padhy
International Journal of Electrical and Electronics Research
ISSN 2348-6988 (online)
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