Abstract: Shot peening is a cold working process in which millions of peening media are shot onto a substrate surface. The impacts of these media produce a layer of compressive stress over the target component. This residual compressive layer has been proven to significantly improve fatigue life by reducing the magnitude of alternating stress applied to the part over a typical life cycle. Several methods have been developed to predict shot peened residual stresses. They have been shown to accurately represent measured residual data using x-ray diffraction. Numerical methods which utilize finite element solvers simulate shot peening media impacting a substrate surface and the resulting plastic deformation. Analytical methods utilize Hertzian theory to calculate the deformation of the substrate surface after a single shot impact, which is then expanded to predict a fully developed residual profile. However, the integration of these methods into analytical systems predicting the actual benefit of shot peening is limited. The new analytical methods, techniques and algorithms developed in this study aim to address the issue of limited integration of shot peening residual stress into structural applications. In this assessment, an APDL algorithm compatible with the ANSYS finite element solver is developed that enables a user to apply these analytical methods and subsequently predict the benefit of shot peening to static structures under varying load conditions. The methodologies and algorithms developed in this assessment successfully predict shot peening profiles and integrate them with finite element static structural solvers. They can be utilized for real industrial applications and solutions can be quickly computed with reasonably sized models.
Keywords: Design and analysis of residual stresses.
Title: Design and Analysis of a Residual Stresses from Shot Peening and Its Analytical and Fem Method
Author: Ennala Sandeep, K.Shravan Kumar
International Journal of Mechanical and Industrial Technology
ISSN 2348-7593 (Online)
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