Abstract: There are various methods for measuring the intensity of a scattered X-ray beam (hereafter referred to as diffracted X-ray beam) from crystalline materials, and each method has the respective advantage. The most common method is to measure the X-ray diffraction intensity from a powder sample as a function of scattering angle (it is also called diffraction angle) by using a diffractometer. Due to this fact, in this research note, we present the several key points of structural analysis which are required to obtain the structural information of powder samples.
Keywords: Structure, crystal system, X-ray, miller index.
Title: Structural analysis by X-ray Diffraction
Author: M.P. Sharma, Parijat Thakur, R. K. Pandey
International Journal of Mathematics and Physical Sciences Research
ISSN 2348-5736 (Online)
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